top of page

Identifying Required Safety Instrumented Functions for HIGH-TECH & SEMICONDUCTOR MANUFACTURING

by Michael D. Scott, P.E., aeSolutions founder & Ken O’Malley, P.E., aeSolutions founder


This paper will discuss the issues, decisions, and challenges encountered when attempting to initially apply the concepts of the Safety Lifecycle per ANSI / ISA S84.01 to the design of a Life Safety System at a state of the art fiber optic manufacturing facility. More specifically, the methodology / procedures utilized for identification of Safety Instrumented Functions (SIF) and subsequent Safety Integrity Level (SIL) determination will be discussed in detail. In addition, industry specific issues associated with the design of Life Safety Systems and the use of mitigation versus prevention techniques (typically encountered in the process industry) will also be discussed.


KEYWORDS: ANSI / ISA S84.01, Safety Instrumented Systems, Safety Instrumented Functions, Safety Integrity Levels, Life Safety Systems


IDENTIFYING REQUIRED SAFETY INSTRUMENTED FUNCTIONS FOR LIFE SAFETY SYSTEMS IN THE HIGH-TECH AND SEMICONDUCTOR MANUFACTURING INDUSTRIES


Unlock this download by completing the following form:





Comments


Want all our best content in your inbox?
Sign up now!
Sign up now!

aeSolutions sends out an email newsletter ever other month of our most popular blogs, webinar, whitepapers, and more.

bottom of page